Authors
Gang Cao, Yao Zhao, Rongrong Ni, Alex C Kot
Publication date
2011/8/18
Journal
IEEE Signal Processing Letters
Volume
18
Issue
10
Pages
603-606
Publisher
IEEE
Description
In this letter, we propose a new method in detecting unsharp masking (USM) sharpening operation in digital images. Overshoot artifacts are found to occur around side-planar edges in the sharpened images. Such artifacts, measured by a sharpening detector, can serve as a rather unique feature for identifying the previous performance of sharpening operation. Test results on photograph images with regard to various sharpening operators show the effectiveness of our proposed method.
Total citations
20122013201420152016201720182019202020212022202320241914810711171712336
Scholar articles