Authors
Canyu Hu, Xing Chen, Jianbo Jin, Yong Han, Shuangming Chen, Huanxin Ju, Jun Cai, Yunrui Qiu, Chao Gao, Chengming Wang, Zeming Qi, Ran Long, Li Song, Zhi Liu, Yujie Xiong
Publication date
2019/4/30
Journal
Journal of the American Chemical Society
Volume
141
Issue
19
Pages
7807-7814
Publisher
American Chemical Society
Description
Nitrogen fixation in a simulated natural environment (i.e., near ambient pressure, room temperature, pure water, and incident light) would provide a desirable approach to future nitrogen conversion. As the N≡N triple bond has a thermodynamically high cleavage energy, nitrogen reduction under such mild conditions typically undergoes associative alternating or distal pathways rather than following a dissociative mechanism. Here, we report that surface plasmon can supply sufficient energy to activate N2 through a dissociative mechanism in the presence of water and incident light, as evidenced by in situ synchrotron radiation-based infrared spectroscopy and near ambient pressure X-ray photoelectron spectroscopy. Theoretical simulation indicates that the electric field enhanced by surface plasmon, together with plasmonic hot electrons and interfacial hybridization, may play a critical role in N≡N dissociation …
Total citations
20192020202120222023202464766495442
Scholar articles
C Hu, X Chen, J Jin, Y Han, S Chen, H Ju, J Cai, Y Qiu… - Journal of the American Chemical Society, 2019