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The films formed on ultrahigh purity Mg, Elektron 717 (ZE10A), and AZ31B in water at room temperature were characterized by TEM, XPS, and SIMS. The films consisted primarily of MgO, with surface regions also containing Mg (OH) 2 and MgCO 3. SIMS suggested H throughout the films and into the underlying metal. Segregation of Zn to the metal/film interface and Al in the film was observed for AZ31B. Similar Zn film segregation was also detected for Elektron 717, along with Nd at the alloy/film interface and nano-size Zn 2 Zr 3 precipitates throughout the film. Implications of these findings on film growth are discussed.