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The domain structure of ferroelectric ceramics can be altered by the process of electrical poling. This paper develops quantitative approaches for reflection geometry and spherical harmonic texture analysis, both of which describe these changes at angles parallel to and tilted from the poling axis. The x-ray-diffraction approach uses the relative intensity ratio of ferroelectric poles in poled and unpoled lead zirconate titanate to calculate a domain switching fraction (η) or a multiple of a random distribution, which are shown to be linearly related. An x-ray area detector diffractometer was used for these measurements, although the technique applies to any x-ray reflection geometry. The neutron-diffraction approach employs a Rietveld refinement with a spherical harmonic texture model. Both approaches calculate similar domain textures for two poling fields and the small differences between the approaches can be …