Authors
Xing Zhang, Huaqing Xie, Motoo Fujii, Hiroki Ago, Koji Takahashi, Tatsuya Ikuta, Hidekazu Abe, Tetsuo Shimizu
Publication date
2005/4/25
Journal
Applied Physics Letters
Volume
86
Issue
17
Publisher
AIP Publishing
Description
This letter reports on the measurements of the in-plane thermal conductivity and the electrical conductivity of a microfabricated, suspended, nanosized platinum thin film with the width of 260 nm, the thickness of 28 nm, and the length of 5.3 μ m. The experimental results show that the electrical conductivity, the resistance-temperature coefficient and the in-plane thermal conductivity of the nanofilm are greatly lower than the corresponding bulk values from 77 to 330 K. The comparison results indicate that the relation between the thermal conductivity and the electrical conductivity of this nanofilm might not follow the Wiedemann–Franz law that describes the relation between the thermal conductivity and the electrical conductivity of a bulk metallic material.
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Scholar articles
X Zhang, H Xie, M Fujii, H Ago, K Takahashi, T Ikuta… - Applied Physics Letters, 2005