Authors
HJ Barnaby, RD Schrimpf, DM Fleetwood, SL Kosier
Publication date
1998/9/29
Conference
Proceedings of the 1998 Bipolar/BiCMOS Circuits and Technology Meeting (Cat. No. 98CH36198)
Pages
35-38
Publisher
IEEE
Description
Radiation response comparisons of lateral PNP bipolar devices manufactured with and without emitter-tied field plates are presented. The experimental results reveal that the devices with an emitter-tied field plate have higher current gain prior to exposure to ionizing radiation. However, the use of an emitter-tied field plate in total dose environments may provide no higher reliability against current gain degradation after significant amounts of radiation exposure.
Total citations
Scholar articles
HJ Barnaby, RD Schrimpf, DM Fleetwood, SL Kosier - Proceedings of the 1998 Bipolar/BiCMOS Circuits and …, 1998