Authors
HJ Barnaby, RD Schrimpf, DM Fleetwood, SL Kosier
Publication date
1998/9/29
Conference
Proceedings of the 1998 Bipolar/BiCMOS Circuits and Technology Meeting (Cat. No. 98CH36198)
Pages
35-38
Publisher
IEEE
Description
Radiation response comparisons of lateral PNP bipolar devices manufactured with and without emitter-tied field plates are presented. The experimental results reveal that the devices with an emitter-tied field plate have higher current gain prior to exposure to ionizing radiation. However, the use of an emitter-tied field plate in total dose environments may provide no higher reliability against current gain degradation after significant amounts of radiation exposure.
Total citations
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Scholar articles
HJ Barnaby, RD Schrimpf, DM Fleetwood, SL Kosier - Proceedings of the 1998 Bipolar/BiCMOS Circuits and …, 1998