Authors
Nicholas M Atkinson, Arthur F Witulski, W Timothy Holman, Jonathan R Ahlbin, Bharat L Bhuva, Lloyd W Massengill
Publication date
2011/2/4
Journal
IEEE Transactions on Nuclear Science
Volume
58
Issue
3
Pages
885-890
Publisher
IEEE
Description
A layout technique that exploits single-event transient pulse quenching to mitigate transients in combinational logic is presented. TCAD simulations show as much as 60% reduction in sensitive area and 70% reduction in pulse width for some logic cells.
Scholar articles
NM Atkinson, AF Witulski, WT Holman, JR Ahlbin… - IEEE Transactions on Nuclear Science, 2011