Authors
Oluwole A Amusan, Lloyd W Massengill, Mark P Baze, Andrew L Sternberg, Arthur F Witulski, Bharat L Bhuva, Jeffrey D Black
Publication date
2008/6/20
Journal
IEEE Transactions on Device and Materials Reliability
Volume
8
Issue
3
Pages
582-589
Publisher
IEEE
Description
Circuit and 3D technology computer aided design mixed-mode simulations show that the single event upset vulnerability of 130- and 90-nm hardened latches to low linear energy transfer (LET) particles is due to charge sharing between multiple nodes as a result of a single ion strike. The low LET vulnerability of the hardened latches is verified experimentally.
Total citations
Scholar articles
OA Amusan, LW Massengill, MP Baze, AL Sternberg… - IEEE Transactions on Device and Materials Reliability, 2008