Authors
Balaji Narasimham, Vishwa Ramachandran, Bharat L Bhuva, Ronald D Schrimpf, Arthur F Witulski, William Timothy Holman, Lloyd W Massengill, Jeffery D Black, William H Robinson, Dale McMorrow
Publication date
2006/12/4
Journal
IEEE Transactions on Device and Materials Reliability
Volume
6
Issue
4
Pages
542-549
Publisher
IEEE
Description
A new on-chip single-event transient (SET) test structure has been developed to autonomously characterize the widths of random SET pulses. Simulation results show measurement granularity of 900 ps for a 1.5 mum technology and also indicate that the measurement granularity rapidly scales down with technology. Laser tests were used to demonstrate circuit operation on test chips fabricated using a 1.5 mum process. The experimental results indicate pulsewidths varying from about 900 ps to over 3 ns as the laser energy was increased
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Scholar articles
B Narasimham, V Ramachandran, BL Bhuva… - IEEE Transactions on Device and Materials Reliability, 2006