Authors
TD Loveless, LW Massengill, BL Bhuva, WT Holman, AF Witulski, Y Boulghassoul
Publication date
2006/12/19
Journal
IEEE transactions on nuclear science
Volume
53
Issue
6
Pages
3432-3438
Publisher
IEEE
Description
A RHBD topology for digital phase-locked loops (DPLLs) has been developed for single-event transient (SET) mitigation. By replacing the vulnerable current-based charge pump with a SET-resistant tri-state voltage-switching charge pump and a low-pass filter, the DPLL single-event susceptibility was considerably reduced, while simultaneously decreasing the lock-in time of the DPLL. The design results in a decreased area requirement with minimal impacts on phase jitter and power consumption. Furthermore, the design eliminates the charge pump as the most vulnerable module and significantly hardens the DPLL
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TD Loveless, LW Massengill, BL Bhuva, WT Holman… - IEEE transactions on nuclear science, 2006