Authors
TD Loveless, LW Massengill, BL Bhuva, WT Holman, AF Witulski, Y Boulghassoul
Publication date
2006/12/19
Journal
IEEE transactions on nuclear science
Volume
53
Issue
6
Pages
3432-3438
Publisher
IEEE
Description
A RHBD topology for digital phase-locked loops (DPLLs) has been developed for single-event transient (SET) mitigation. By replacing the vulnerable current-based charge pump with a SET-resistant tri-state voltage-switching charge pump and a low-pass filter, the DPLL single-event susceptibility was considerably reduced, while simultaneously decreasing the lock-in time of the DPLL. The design results in a decreased area requirement with minimal impacts on phase jitter and power consumption. Furthermore, the design eliminates the charge pump as the most vulnerable module and significantly hardens the DPLL
Total citations
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Scholar articles
TD Loveless, LW Massengill, BL Bhuva, WT Holman… - IEEE transactions on nuclear science, 2006