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New memory technologies and processes introduce new defects that cause previously unknown faults. Dynamic faults are among these new faults; they can take place in the absence of the traditional static faults. This paper describes the concept of dynamic faults, based on the fault primitive concept. It further shows, based on industrial test results, the importance of such faults for the new memory technologies, and introduces a systematic way for modeling them. It concludes that current and future SRAM products need to consider testability for dynamic faults or leave substantial DPM on the table, and it sets a direction for further research.