Authors
Said Hamdioui, Ad J Van de Goor, Mike Rodgers
Publication date
2002/7/12
Conference
Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT2002)
Pages
95-100
Publisher
IEEE
Description
This paper presents all simple (i.e., not linked) static fault models that have been shown to exist for random access memories (RAMs), and shows that none of the current industrial march tests has the capability to detect all these faults. It therefore introduces a new test (March SS), with a test length of 22n, that detects all realistic simple static faults in RAMs.
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Scholar articles
S Hamdioui, AJ Van de Goor, M Rodgers - Proceedings of the 2002 IEEE International Workshop …, 2002