Authors
Jing Wan, Zhen Shu, Shao-Ren Deng, Shen-Qi Xie, Bing-Rui Lu, Ran Liu, Yifang Chen, Xin-Ping Qu
Publication date
2009/1/1
Journal
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena
Volume
27
Issue
1
Pages
19-22
Publisher
AIP Publishing
Description
In this work, a trilayer technique used in the nanoimprint lithography process to replicate the templates is developed. The SU8/SiO 2/PMMA trilayer was used. The photosensitive epoxy (SU8 resist) which has a low glass transition temperature was used as the imprint layer. Polymethylmethacrylate (PMMA) was used as the transfer layer. A SiO 2 layer is placed between the SU8 and PMMA to act as a protective layer due to its strong resistance to oxygen reactive ion etching. By optimizing imprint and etching processes, master templates with minimum feature size of 150 nm and period of 300 nm can be successfully duplicated.
Total citations
20092010201120122013201420152016201720182019202020212022202323111
Scholar articles
J Wan, Z Shu, SR Deng, SQ Xie, BR Lu, R Liu, Y Chen… - Journal of Vacuum Science & Technology B …, 2009