Authors
DF Ogletree, Robert W Carpick, Miguel Salmeron
Publication date
1996/9/1
Journal
Review of Scientific Instruments
Volume
67
Issue
9
Pages
3298-3306
Publisher
American Institute of Physics
Description
The atomic force microscope can provide information on the atomic‐level frictional properties of surfaces, but reproducible quantitative measurements are difficult to obtain. Parameters that are either unknown or difficult to precisely measure include the normal and lateral cantilever force constants (particularly with microfabricated cantilevers), the tip height, the deflection sensor response, and the tip structure and composition at the tip‐surface contact. We present an insitu experimental procedure to determine the response of a cantilever to lateral forces in terms of its normal force response. This procedure is quite general. It will work with any type of deflection sensor and does not require the knowledge or direct measurement of the lever dimensions or the tip height. In addition, the shape of the tip apex can be determined. We also discuss a number of specific issues related to force and friction measurements using …
Total citations
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Scholar articles
DF Ogletree, RW Carpick, M Salmeron - Review of Scientific Instruments, 1996