Authors
Sviatoslav Voloshynovskiy, Frédéric Deguillaume, Thierry Pun
Publication date
2001/10/7
Conference
Proceedings 2001 International Conference on Image Processing (Cat. No. 01CH37205)
Volume
3
Pages
999-1002
Publisher
IEEE
Description
This paper presents an efficient method for the estimation and recovering from nonlinear or local geometrical distortions, such as the random bending attack and restricted projective transforms. The distortions are modeled as a set of local affine transforms, the watermark being repeatedly allocated into small blocks in order to ensure its locality. The estimation of the affine transform parameters is formulated as a robust penalized maximum likelihood (ML) problem, which is suitable for the local level as well as for global distortions. Results with the Stirmark benchmark confirm the high robustness of the proposed method and show its state-of-the-art performance.
Total citations
200120022003200420052006200720082009201020112012201320142015201620172018201920202021202220232024172221229111113124851543212312
Scholar articles
S Voloshynovskiy, F Deguillaume, T Pun - Proceedings 2001 International Conference on Image …, 2001