Authors
Adrien Guery, François Hild, Félix Latourte, Stéphane Roux
Publication date
2013/5/27
Conference
PhotoMechanics 2013
Pages
27--29
Description
An identification procedure of parameters of a crystal plasticity law based on kinematic measurements is presented. First, the surface deposition of a random pattern to conduct Scanning Electron Microscope (SEM) imaging is performed. A Digital Image Correlation (DIC) method is then used to measure displacement fields that are compatible with the polycrystal geometry during an in-situ tensile test. These measurements are finally combined with a finite element simulation of the corresponding experiment that allows the identification of a set of parameters of a crystal plasticity law to be determined.