Authors
Raynald Gauvin, Nicolas Brodusch, Frédéric Voisard, Nicolas Dumaresq, Karim Zaghib, Hendrix Demers, Michel Trudeau
Publication date
2021/8
Journal
Microscopy and Microanalysis
Volume
27
Issue
S1
Pages
1868-1869
Publisher
Cambridge University Press
Description
This paper will present state of the art results of EDS and EELS of Lithium based materials acquired with the SU-9000 dedicated STEM that has EELS capabilities and the Extreme EDS system from Oxford Scientific that can detect the Kα line of Lithium [1]. Lithium can be detected with EELS in this microscope [2] but this is not the focus of this paper that will concentrate on EDS of Lithium. The SU-9000 has a resolution of 0, 22 nm in bright field STEM without aberration correctors and it allows lattice imaging.
Total citations
2022202311
Scholar articles
R Gauvin, N Brodusch, F Voisard, N Dumaresq… - Microscopy and Microanalysis, 2021