Authors
Nicolas Dumaresq, Raynald Gauvin, Karim Zaghib
Publication date
2020/5/1
Journal
Electrochemical Society Meeting Abstracts 237
Issue
4
Pages
525-525
Publisher
The Electrochemical Society, Inc.
Description
In material sciences, in order to develop new compounds with different electrical, mechanical or optical properties we need to understand the link between these properties and the microstructure of the material. This apply also to understand the decrease of efficiency of a battery after multiple charge-discharge cycle where the structural changes need to be identify in order to prevent it. Scanning transmission electron microscopy (STEM) has been proven to be a powerful tool for the study of microstructure and morphology with a subnanometer resolution. Furthermore, a STEM paired with electron energy loss spectroscopy (EELS) can provide useful information on the specimen elemental composition. However, these technique are normally used with a high electron beam voltage (80-200 keV) and the high energy of the electron beam induce beam damage into low Z materials such as lithium compound. This …
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N Dumaresq, R Gauvin, K Zaghib - Electrochemical Society Meeting Abstracts 237, 2020