Authors
Serge Belongie, Jitendra Malik, Jan Puzicha
Publication date
2002/4
Journal
IEEE transactions on pattern analysis and machine intelligence
Volume
24
Issue
4
Pages
509-522
Publisher
IEEE
Description
We present a novel approach to measuring similarity between shapes and exploit it for object recognition. In our framework, the measurement of similarity is preceded by: (1) solving for correspondences between points on the two shapes; (2) using the correspondences to estimate an aligning transform. In order to solve the correspondence problem, we attach a descriptor, the shape context, to each point. The shape context at a reference point captures the distribution of the remaining points relative to it, thus offering a globally discriminative characterization. Corresponding points on two similar shapes will have similar shape contexts, enabling us to solve for correspondences as an optimal assignment problem. Given the point correspondences, we estimate the transformation that best aligns the two shapes; regularized thin-plate splines provide a flexible class of transformation maps for this purpose. The …
Total citations
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Scholar articles
S Belongie, J Malik, J Puzicha - IEEE transactions on pattern analysis and machine …, 2002