Authors
Yiling Lou, Ali Ghanbari, Xia Li, Lingming Zhang, Haotian Zhang, Dan Hao, Lu Zhang
Publication date
2020/7/18
Book
Proceedings of the 29th ACM SIGSOFT International Symposium on Software Testing and Analysis
Pages
75-87
Description
A large body of research efforts have been dedicated to automated software debugging, including both automated fault localization and program repair. However, existing fault localization techniques have limited effectiveness on real-world software systems while even the most advanced program repair techniques can only fix a small ratio of real-world bugs. Although fault localization and program repair are inherently connected, their only existing connection in the literature is that program repair techniques usually use off-the-shelf fault localization techniques (e.g., Ochiai) to determine the potential candidate statements/elements for patching. In this work, we propose the unified debugging approach to unify the two areas in the other direction for the first time, i.e., can program repair in turn help with fault localization? In this way, we not only open a new dimension for more powerful fault localization, but also extend …
Total citations
2019202020212022202320241619213418
Scholar articles
Y Lou, A Ghanbari, X Li, L Zhang, H Zhang, D Hao… - Proceedings of the 29th ACM SIGSOFT International …, 2020