Authors
Xia Li, Wei Li, Yuqun Zhang, Lingming Zhang
Publication date
2019/7/10
Book
Proceedings of the 28th ACM SIGSOFT international symposium on software testing and analysis
Pages
169-180
Description
Learning-based fault localization has been intensively studied recently. Prior studies have shown that traditional Learning-to-Rank techniques can help precisely diagnose fault locations using various dimensions of fault-diagnosis features, such as suspiciousness values computed by various off-the-shelf fault localization techniques. However, with the increasing dimensions of features considered by advanced fault localization techniques, it can be quite challenging for the traditional Learning-to-Rank algorithms to automatically identify effective existing/latent features. In this work, we propose DeepFL, a deep learning approach to automatically learn the most effective existing/latent features for precise fault localization. Although the approach is general, in this work, we collect various suspiciousness-value-based, fault-proneness-based and textual-similarity-based features from the fault localization, defect prediction …
Total citations
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Scholar articles
X Li, W Li, Y Zhang, L Zhang - Proceedings of the 28th ACM SIGSOFT international …, 2019