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Figure 1. Low-voltage, high-resolution TEM was used to directly observe the structure of graphene oxide. A heating chip containing a platinum coil (a) is used to study the temperature dependence of the structure. A slit was introduced into the thin silicon nitride membrane using a focused ion beam (FIB)(b) in order to obtain suspended GO. Low-magnification images (c, d) show the macroscopic morphology of graphene oxide: clumped flakes with monolayer regions.