Authors
Abdulilah Mohammad Mayet, VP Thafasal Ijyas, M Ramkumar Raja, Mohammed Abdul Muqeet, Neeraj Kumar Shukla
Publication date
2024/6/1
Journal
Applied Radiation and Isotopes
Volume
208
Pages
111310
Publisher
Pergamon
Description
Radiation-based gauges have been widely utilized in the industry as a dependable, non-destructive method of measuring metal layer thickness. It is only possible to trust the conventional radiation thickness meter when the material's composition is known in advance. Thickness measurement errors are to be anticipated in contexts like rolled metal factories, where the real component of the material could diverge greatly from the stated composition. An X-ray-based device was suggested in this study to measure aluminum sheet thickness and identify the type of its alloys. Transmission and backscattered X-ray energy were recorded using two sodium iodide detectors while a 150 kV X-ray tube in the described detection system was operated. Aluminum layers of varying thicknesses (2–45 mm) and alloys (1050, 3105, 5052, and 6061) were simulated to be placed between the X-ray source and the transmission detector …