Characteristic Variability and Random Telegraph Noise of Gate-All-Around Silicon Nanowire MOSFETs with Asymmetric Dual Spacer Induced by Single Charge Trap
Authors
Sekhar Reddy Kola, Yiming Li, Narasimhulu Thoti
Publication date
2019/9
Conference
International Conference on Solid State Devices and Materials (SSDM)
Pages
633-634
Scholar articles