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We for the first time investigate the possibility to replace the device simulation for tunnel field-effect transistors (TFETs) with a machine learning (ML) algorithm. By incorporating the experimentally validated device simulation, a keyML technique named random forest regression (RFR) model is advanced and applied to predict characteristics of TFETs. The results of this work may benefit the design and fabrication of TFETs based on the well-trained RFR model. Very fast and accurate drain current (ID) prediction in terms of the engineering acceptable root-mean-square (RMSE) error inaugurates TFET technology with ML with a potential application to significantly reduce the computational cost.