Authors
Gustaaf Van Tendeloo, Sara Bals, Sandra Van Aert, Jo Verbeeck, Dirk Van Dyck
Publication date
2012/11/8
Source
Advanced materials
Volume
24
Issue
42
Pages
5655-5675
Publisher
WILEY‐VCH Verlag
Description
The idea of this Review is to introduce newly developed possibilities of advanced electron microscopy to the materials science community. Over the last decade, electron microscopy has evolved into a full analytical tool, able to provide atomic scale information on the position, nature, and even the valency atoms. This information is classically obtained in two dimensions (2D), but can now also be obtained in 3D. We show examples of applications in the field of nanoparticles and interfaces.
Total citations
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Scholar articles
G Van Tendeloo, S Bals, S Van Aert, J Verbeeck… - Advanced materials, 2012