Authors
Peter Duerden, DD Cohen, Eric Clayton, JR Bird, WR Ambrose, BF Leach
Publication date
1979/12/1
Journal
Analytical chemistry
Volume
51
Issue
14
Pages
2350-2354
Publisher
American Chemical Society
Description
Many analytical techniques have been used to study the composition of obsidian from different source regions. In 1976, Nielsen etal.(1) reported the use of Proton Induced X-ray Emission (PIXE) for such measurements. However, they used samples that were specially prepared from acid digests of 30 to 100 µg of finely powdered obsidian, a portion of which was evaporated to dryness on Nucleopore membrane filters. Be-cause of the importance of rapid, nondestructive techniques for the study of artifact collections, we have investigated the use of PIXE measurements on thick samples with no treatment other than washing.
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