Authors
F Demichelis, G Kaniadakis, A Tagliaferro, E Tresso
Publication date
1987
Journal
Applied Optics
Volume
26
Issue
9
Pages
1737-1940
Description
A powerful new technique is reported which enables realistic calculation of the optical energy gap of absorbing thin solid films by an analysis of measured transmittance and reflectance spectra in the fundamental absorption region. At the same time a new analytical method allows the thickness of films to be evaluated by measurements of transmittance only.
Total citations
19881989199019911992199319941995199619971998199920002001200220032004200520062007200820092010201120122013201420152016201720182019202020212022202320245291310214632134242875667717679998721
Scholar articles
F Demichelis, G Kaniadakis, A Tagliaferro, E Tresso - Applied Optics, 1987
F Demichelis, G Kaniadakis - Appl. Optics, 1987