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Defect prediction on projects with limited historical data has attracted great interest from both researchers and practitioners. Cross-project defect prediction has been the main area of progress by reusing classifiers from other projects. However, existing approaches require some degree of homogeneity (e.g., a similar distribution of metric values) between the training projects and the target project. Satisfying the homogeneity requirement often requires significant effort (currently a very active area of research).

An unsupervised classifier does not require any training data, therefore the heterogeneity challenge is no longer an issue. In this paper, we examine two types of unsupervised classifiers: a) distance-based classifiers (e.g., k-means); and b) connectivity-based classifiers. While distance-based unsupervised classifiers have been previously used in the defect prediction literature with disappointing performance …