Authors
Jianxiong Zhou, Ying Wu
Publication date
2024/5/31
Journal
IEEE Transactions on Circuits and Systems for Video Technology
Publisher
IEEE
Description
In the realm of large-scale industrial manufacturing, the precise detection of defective parts stands as a critical imperative. While current unsupervised anomaly detection algorithms exhibit commendable accuracy when applied to clean training datasets, their susceptibility to contaminated training data limits their real-world efficacy. In response to this challenge, this paper proposes a novel Outlier-Probability-Based Feature Adaptation (OPFA) network to realize robust unsupervised anomaly detection on contaminated training data. This method distinguishes itself by maintaining both high accuracy and robustness in the face of contaminated training data, enabling effective learning of discriminative features for anomaly detection. Specifically, the model enhances feature representations through the contraction of normal features and the contrast between normal and outlier features. Our methodology employs an …
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