Yogesh S. Chauhan

Yogesh S. Chauhan

Fellow IEEE, FNAE, Professor-IIT Kanpur
Verified email at iitk.ac.in
Cited by 7055
ASM GaN HEMT Compact Model BSIM SPICE Model Cryogenic Transistor Modeling Ferroelectric Negative Capacitance Transistor
Chhandak Mukherjee

Chhandak Mukherjee

Chargé de Rechereche CNRS, IMS Laboratory, University of Bordeaux, France
Verified email at ims-bordeaux.fr
Cited by 756
Characterization Compact Model Reliability Low-frequency Noise
Md Abdul Wahab

Md Abdul Wahab

Intel, Hillsboro, Oregon, Purdue University
Verified email at intel.com
Cited by 685
Compact Model Device Physics Variability and Reliability Array of Nanotubes/Nanowires 2D Nanomaterials
Huan-Lin Chang

Huan-Lin Chang

Verified email at ieee.org
Cited by 631
Compact model SPICE model
Thomas Jacquet

Thomas Jacquet

Cited by 119
electronics reliabilty compact model MBSA
Huaiyuan Zhang

Huaiyuan Zhang

Keysight Technologies
Verified email at auburn.edu
Cited by 22
semiconductor device models heterojunction bipolar transistors compact model CMOS integrated circuits
Man Yang

Man Yang

NXP Semiconductors
Verified email at nxp.com
Cited by 5
compact model SOI
Wang Shuhan

Wang Shuhan

Peking University
Verified email at stu.pku.edu.cn
compact model