Peimei Da

Peimei Da

KLA Corporation
Verified email at kla.com
Cited by 5220
Defect Inspection Compound Semiconductor Solar Energy Utilization Perovskite Solar Cell
Shiyuan Liu (刘世元)

Shiyuan Liu (刘世元)

Huazhong University of Science and Technology
Verified email at hust.edu.cn
Cited by 4805
Ellipsometry Scatterometry Nanometrology Defect Inspection Thin Film Characterization
Qian Wang (王骞)

Qian Wang (王骞)

Southeast University
Verified email at seu.edu.cn
Cited by 3955
LiDAR Computer Vision Defect Inspection Scan-to-BIM Quality Management
Chia-Yu Hsu

Chia-Yu Hsu

Department of Industrial Management, National Taiwan University of Science and …
Verified email at mail.ntust.edu.tw
Cited by 1905
machine learning big data analytics predictive maintenance fault detection defect inspection
yu he

yu he

Shenyang University of Technology
Verified email at sut.edu.cn
Cited by 1745
Defect inspection Deep learning
I-Ting Kuo

I-Ting Kuo

Macronix
Verified email at mxic.com.tw
Cited by 267
Defect inspection yield enhancement OTS selector and phase change materials …
Jie Gong

Jie Gong

KLA-Tencor Corporation
Verified email at kla-tencor.com
Cited by 153
semiconductor processing defect inspection quality and reliability
Enrique Dehaerne

Enrique Dehaerne

PhD student; KU Leuven, Imec
Verified email at kuleuven.be
Cited by 128
Defect Inspection Metrology EDA Robotics
Chong Shen

Chong Shen

KLA-tencor
Verified email at kla-tencor.com
Cited by 62
Optics Defect inspection Active particles Soft matter Colloid
Chuhan Wang

Chuhan Wang

Hebei University of Technology
Verified email at stu.hebut.edu.cn
Cited by 47
Deep Learning CV Defect Inspection Intelligent Manufacturing
1 - 10