Profiles

Takashi Sekiguchi

Faculty of Pure & Applied Sciences, Univ. Tsukuba

Verified email at u.tsukuba.ac.jp

Cited by 20127

Electron Microscopy defects in semiconductors

Seibt

Professor of Physics, Goettingen University

Verified email at gwdg.de

Cited by 7513

Defects in Semiconductors Transmission electron microscopy Structure and properties of interfaces

SK Estreicher

Texas Tech University

Verified email at ttu.edu

Cited by 7054

defects in semiconductors

Lutz Kirste

Dr. rer. nat., Fraunhofer IAF

Verified email at iaf.fraunhofer.de

Cited by 4656

Defects in semiconductors

Behrang H. Hamadani

National Institute of Standards and Technology

Verified email at nist.gov

Cited by 3760

photovoltaics wide bandgap materials device characterization physics defects in semiconductors

Lourdes Pelaz

University of Valladolid

Verified email at ele.uva.es

Cited by 3552

Semiconductor process modeling defects in semiconductors

Damien West

Research Scientist, Rensselaer Polytechnic Institute

Verified email at rpi.edu

Cited by 3036

defects in semiconductors statistical physics topological insulators

Susanne Mirbt

Professor of Physics, Uppsala University

Verified email at physics.uu.se

Cited by 2629

defects in semiconductors polarons interfaces

Ravindran Vidya

Associate Professor, Department of Physics, Anna University

Verified email at annauniv.edu

Cited by 2378

Density functional calculations Perovskite Oxides Transition-metal Oxides Defects in semiconductors Optical properties

Roman Gröger

Institute of Physics of Materials, Czech Academy of Sciences

Verified email at ipm.cz

Cited by 1763

atomistic simulations dislocations coarse-graining defects in semiconductors image simulation

1 - 10