Janusz Rajski

Janusz Rajski

Vice President of Engineering, Siemens
Verified email at mentor.com
Cited by 16235
Electronic Design Automation VLSI Testing Design For Test
Bashir M. Al-Hashimi

Bashir M. Al-Hashimi

Professor of Computer Engineering, King's College London
Verified email at kcl.ac.uk
Cited by 11430
Energy-efficient computing embedded systems design for test
Mehdi B. Tahoori

Mehdi B. Tahoori

Professor of Computer Science, Karlsruhe Institute of Technology, Germany
Verified email at kit.edu
Cited by 10825
reliable computing printed electronics electronic design automation design for test emerging technologies
Wu-Tung Cheng

Wu-Tung Cheng

chief scientist, mentor graphics
Verified email at mentor.com
Cited by 6502
design for test
Nilanjan Mukherjee

Nilanjan Mukherjee

Senior Engineering Director, Siemens Digital Industries Software
Verified email at mentor.com
Cited by 6041
Design-for-Test Memory Testing ATPG Fault simulation Compression
Tim Cowles

Tim Cowles

TIE - Texas Institute For Electronics
Verified email at austin.utexas.edu
Cited by 2443
DRAM & Emerging Memory Semiconductors Design For Test Cloud
Erik Larsson

Erik Larsson

Lunds Universitet
Verified email at eit.lth.se
Cited by 2139
Design for test test fault tolerance
Érika Cota

Érika Cota

Universidade Federal do Rio Grande do Sul
Verified email at inf.ufrgs.br
Cited by 1995
test of embedded systems software test hardware test design for test
Naghmeh Karimi

Naghmeh Karimi

Associate Professor, Computer Science & Electrical Eng., University of Maryland Baltimore …
Verified email at umbc.edu
Cited by 1583
Hardware Security & Reliability Design-for-Security Design-for-Reliability Design-for-Test VLSI
Diego Vázquez

Diego Vázquez

Profesor, Universidad de Sevilla, IMSE-CNM-CSIC
Verified email at us.es
Cited by 1314
Design&Test analog&RF microelectronic Mixed-Signal ICs Design-for-Test ASICs for Space
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