Ivan Gutierrez-Urrutia

Ivan Gutierrez-Urrutia

NIMS
Verified email at nims.go.jp
Cited by 6535
Materials Science High-strength steels Electron Microscopy ECCI EBSD
Julien Guyon

Julien Guyon

Université de Lorraine
Verified email at univ-lorraine.fr
Cited by 713
FIB SEM EBSD TKD ECCI
Zhou Xu

Zhou Xu

Monash Centre for Electron Microscopy
Verified email at monash.edu
Cited by 479
Electron diffraction ECCI CL 4D-STEM Instrument development
Brian Bennett Haidet

Brian Bennett Haidet

Graduate of the Materials Department, University of California: Santa Barbara
Verified email at umail.ucsb.edu
Cited by 346
IV-VI Semiconductors MBE Growth ECCI
Haithem Mansour

Haithem Mansour

PhD in Materials Science, Product Manager, Oxford Instruments
Verified email at oxinst.com
Cited by 270
Scanning Electron Microscopy EDS EBSD ECCI
Yong Jia

Yong Jia

Harbin Institute of Technology
Verified email at stu.hit.edu.cn
Cited by 158
Magnesium PFIB EBSD ECCI
Arka Mandal

Arka Mandal

Postdoctoral researcher, Université de Lorraine – CNRS – Arts et Métiers – LEM3
Verified email at univ-lorraine.fr
Cited by 150
Mechanical Metallurgy Nanoindentation Micro-mechanical behaviour of materials Electron microscopy ECCI