Profiles

Joan Marc Rafí

Instituto de Microelectrónica de Barcelona, IMB-CNM, CSIC, Científico Titular del CSIC

Verified email at csic.es

Cited by 21414

Electrical characterization Electrical Reliability Radiation effects Advanced CMOS devices Semiconductor radiation detectors

Tony Schenk

Member of Technical Staff & Lead of Stack Development at Ferroelectric Memory Company

Verified email at ferroelectric-memory.com

Cited by 8263

ferroelectrics HfO2 structural characterization electrical characterization

Lars Fast

RISE Research Institutes of Sweden

Verified email at ri.se

Cited by 4379

Battery Fuel Cell Resistance measurement Solid state physics Electrical characterization

Henrique Leonel Gomes

Universidade de Coimbra /Instituto de Telecomunicações

Verified email at uc.pt

Cited by 3654

Organic Electronics Bioelectronics Device Physics Electrical Characterization Resistive Switching Memories

Necmettin Kilinc

Inonu University

Verified email at inonu.edu.tr

Cited by 2434

Nanomaterials MEMS Biosensor Chemical Sensor Electrical Characterization

Milan Tapajna

Researcher at Institute of Electrical Engineering SAS

Verified email at savba.sk

Cited by 2223

Electronics Electrical characterization Reliability GaN Ga-oxide

Andrew Hoff

Professor of Electrical Engineering, University of South Florida

Verified email at usf.edu

Cited by 1535

Semiconductor Process Electrical Characterization Drug and Gene Delivery to Cells and Tissue

Ali Gokirmak

Electrical and Computer Engineering, University of Connecticut

Verified email at uconn.edu

Cited by 1492

phase change memory phase change materials field effect transistors (FET) electronic devices electrical characterization

Gino Giusi

Associate Professor, University of Messina (Italy)

Verified email at unime.it

Cited by 1483

Electrical Characterization Modeling and Simulation of nanoscale CMOS …

Ivan Ciofi

Principal Member of Technical Staff, R&D Team Leader, Imec, Belgium

Verified email at imec.be

Cited by 1342

BEOL process technology Electrical characterization Reliability Modeling DTCO

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