Charlie Kong

Charlie Kong

Senior Research Officer, University of New South Wales
Verified email at unsw.edu.au
Cited by 6515
Materials Science Electron Microscopy Focused Ion Beam
Ian MacLaren

Ian MacLaren

University of Glasgow, School of Physics and Astronomy
Verified email at glasgow.ac.uk
Cited by 5244
Electron Microscopy Nanostructure Electron Energy Loss Spectroscopy Direct Electron Detectors Focused Ion Beam
Yuval Greenzweig

Yuval Greenzweig

None
Cited by 4738
planetary science Semiconductor technology circuit edit focused ion beam
Philip Moll

Philip Moll

Max-Planck-Institute for the Structure and Dynamics of Matter, Hamburg, Germany
Verified email at mpsd.mpg.de
Cited by 4141
Topological semi-metals Superconductivity correlated electrons Focused Ion Beam
Christian Boit

Christian Boit

Professor für Halbleiterbauelemente, TU Berlin
Verified email at tu-berlin.de
Cited by 4139
optical interactions of electronic devices focused ion beam
David C Cox

David C Cox

Principal Research Fellow, University of Surrey
Verified email at surrey.ac.uk
Cited by 4123
Focused ion beam Nanofabrication
Braulio Archanjo

Braulio Archanjo

National Institute of Metrology, Quality and Technology of Brazil
Verified email at inmetro.gov.br
Cited by 4118
Nanometrology Electron Microscopy Atomic Force Microscopy Nanofabrication Focused Ion Beam
Lifei Xi

Lifei Xi

FACTS@Nanyang Technological University
Verified email at ntu.edu.sg
Cited by 3839
Catalyst Nanoparticle-plant interaction Novel Materials Focused Ion Beam TEM
Markus Becherer

Markus Becherer

Technische Universtität München, TUM
Verified email at tum.de
Cited by 3296
semiconductors chip-based sensors micormagnetics novel fabrication technology focused-ion-beam
Emmanuelle Boehm-Courjault

Emmanuelle Boehm-Courjault

EPFL-Laboratory for Construction Materials
Verified email at epfl.ch
Cited by 2247
Concrete chemistry cementitious materials scanning electron microscopy transmission electron microscopy focused ion beam
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