Lei HUANG 黄 磊
Optical Metrology, NSLS-II, Brookhaven National Laboratory
Verified email at bnl.gov
Cited by 6556
Beiwen Li
Associate Professor of Mechanical Engineering, University of Georgia
Verified email at uga.edu
Cited by 2239
Ricardo Legarda-Saenz
Faculty of Mathematics, Universidad Autonoma de Yucatan
Verified email at correo.uady.mx
Cited by 649
Jitendra Dhanotia
Indian Institute of Technology, Indore, India
Verified email at iiti.ac.in
Cited by 242