Profiles

Xiaoye Qin

Intel

Cited by 2730

GaN HEMTs XPS Device Characterization

Xun Zheng

Texas Instruments Incorporated

Verified email at ece.ucsb.edu

Cited by 1228

GaN HEMTs Compound Semiconductors BiCMOS

Nicolò Zagni

Post-Doc Researcher, Università degli Studi di Modena e Reggio Emilia

Verified email at unimore.it

Cited by 1083

Semiconductor Devices Reliability TCAD Simulations GaN HEMTs Ferroelectric FETs

Martin Heilmann

PostDoc, imec

Verified email at imec.be

Cited by 826

GaN on Si Epitaxy Nanostructures 2D Materials GaN HEMTs

Lei Li

Cornell University

Verified email at cornell.edu

Cited by 588

GaN HEMTs MMICs mm-wave

Venkata Chivukula

Google LLC

Verified email at google.com

Cited by 326

Sensors SAWs GaN HEMTs Interconnects RFICs

Yang Jiang

The University of Hong Kong/Southern University of Science and Technology

Verified email at mail.sustech.edu.cn

Cited by 278

GaN HEMTs In-Sensor/Memory Computing

Wei-Chih Cheng

The Hong Kong University of Science and Technology

Verified email at connect.ust.hk

Cited by 276

GaN HEMTs

Markus Wohlfahrt

University of Bristol

Cited by 259

GaN HEMTs

Jiaqi Zhang

Ph.D student at The University of Tokyo

Verified email at hotaka.tu-tokyo.ac.jp

Cited by 238

Plasmonics metasurface GaN HEMTs

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