Peter Heinrich Thiesen

Peter Heinrich Thiesen

accurion gmbh
Verified email at accurion.com
Cited by 4141
Imaging Ellipsometry Thin Films Adsorption Silicates
Eun-Soo Hwang

Eun-Soo Hwang

Mechatronic Research, Samsung Electronics
Verified email at samsung.com
Cited by 476
Memory Measurement & Inspection Semiconductor Equipment Imaging Ellipsometry Nano-print MEMS
Dr. Mangesh S. Diware

Dr. Mangesh S. Diware

Application Scientist, Optics R&D center, Park Systems Corp.
Verified email at parksystems.com
Cited by 380
Optical metrology Ellipsometry Imaging ellipsometry Material physics
Sebastian Funke

Sebastian Funke

Verified email at accurion.com
Cited by 324
Imaging Ellipsometry
A. W. Abdallah

AW Abdallah

Researcher, National Institute of Standards
Verified email at nis.sci.eg
Cited by 65
Imaging ellipsometry Polarization interferometry Gauge blocks Length metrology Displacement measurement
Mai Ibrahim Khaleel

Mai Ibrahim Khaleel

Isra University
Verified email at iu.edu.jo
Cited by 13
experimental physics imaging ellipsometry bio-sensing optics