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JPR David
University of Sheffield
Verified email at sheffield.ac.uk
Cited by 10249
Avalanche photodiodes
impact ionization
avalanche breakdown
III-V semiconductors
semiconductor characterisation
Haeju Choi
SAINT, SKKU
Verified email at skku.edu
Cited by 201
2D materials
Impact ionization
Steep-switching device
Avalanche photodetector
Tae ho kang
Sungkyunkwan University
Cited by 37
2D material
steep switching transistor
impact ionization
high-K dielectric/2D material interface …
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