Liang Wang

Liang Wang

University of Illinois at Urbana-Champaign, Texas Instruments
Verified email at ti.com
Cited by 60105
GaN InAlAs/InGaAs HEMTs fabrication characterization metallization
Krish Shenai

Krish Shenai

Sun Valley Electronics, LLC
Cited by 6838
semiconductors power electronics RF power amplifier metallization reliability
Jeng-Yu Lin (林正裕)

Jeng-Yu Lin (林正裕)

Tunghai University
Verified email at thu.edu.tw
Cited by 6764
Metallization Li-ion batteries Supercapacitors Electrochemical sensors
Markus Glatthaar

Markus Glatthaar

PV2+ GmbH
Verified email at pv2plus.com
Cited by 4519
Solar Cells Metallization Manufacturing Characterization Quality assurance
M.H. Tsai

MH Tsai

TSMC, National Chiao-Tung University
Verified email at tsmc.com
Cited by 1824
metallization metal gate semiconductor copper barrier
Dr. Sumana Ghosh

Dr. Sumana Ghosh

CSIR-CGCRI
Verified email at cgcri.res.in
Cited by 1382
Coatings joining metallization microwave processing
Loic TOUS

Loic TOUS

Researcher, imec, Belgium
Verified email at imec.be
Cited by 1363
solar cells photovoltaic Si metallization Copper
Thomas Waechtler

Thomas Waechtler

Infineon Technologies Dresden
Verified email at infineon.com
Cited by 1012
Power Semiconductors IGBT ALD Copper Metallization
Luca Serenelli

Luca Serenelli

ENEA - Research Centre "Casaccia"
Verified email at enea.it
Cited by 998
Photovoltaic device Silicon Heterojunctions Metallization
Jau-Jiun Chen

Jau-Jiun Chen

University of Florida
Verified email at ntu.edu.tw
Cited by 941
Surface Science Band Gap Engineering III-V and II-VI Device Fabrication Metallization Anneal
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