Eliot Gann

Eliot Gann

National Institute of Standards and Technology at NSLS-II at Brookhaven National Lab
Verified email at nist.gov
Cited by 8803
Soft X-ray Scattering Grazing Incidence Scattering Polymer Electronics Morphology Characterization
Zhongxiang Peng

Zhongxiang Peng

Changchun Institute of Applied Chemistry, Chinese Academy of Sciences
Verified email at ciac.ac.cn
Cited by 1530
Organic Photovoltaics Organic Photodetectors Morphology Characterization X-ray Scattering
Guorong Ma

Guorong Ma

PhD in Polymer science, University of Southern Mississippi
Verified email at usm.edu
Cited by 512
X-ray scattering Light scattering Conjugated polymers Morphology Characterization
Gowtham SM

Gowtham SM

Failure Analysis Engineer-II
Verified email at tataelectronics.co.in
Cited by 120
Batteries Morphology characterization Failure Analysis
Khaled H. Khafagy

Khaled H. Khafagy

Arizona State University
Verified email at asu.edu
Cited by 94
Ceramic matrix composite Silicon defects Thermomechanical testing Morphology characterization High fidelity modeling