Qiang (Michael) Gao

Qiang (Michael) Gao

Fellow, Dept Electronic Materials Engineering, The Australian National University
Verified email at anu.edu.au
Cited by 32385
Markus Weyers

Markus Weyers

Dept. Head Materials Technology, Ferdinand-Braun-Institut
Verified email at fbh-berlin.de
Cited by 15243
Joël Eymery

Joël Eymery

UGA, CEA, IRIG-MEM, Nanostructure and X-Ray Lab. (HDR, Dr Res. & Senior Expert CEA)
Verified email at cea.fr
Cited by 5848
Pelucchi Emanuele

Pelucchi Emanuele

Tyndall National Institute, University College Cork
Verified email at tyndall.ie
Cited by 5303
Katsuhiro Tomioka

Katsuhiro Tomioka

Hokkaido University / Associate Professor
Verified email at rciqe.hokudai.ac.jp
Cited by 5158
Ignacio Rey-Stolle

Ignacio Rey-Stolle

Universidad Politécnica de Madrid
Verified email at upm.es
Cited by 3834
Lai Wang

Lai Wang

Department of Electronic Engineering, Tsinghua University, 100084 Beijing, China
Verified email at tsinghua.edu.cn
Cited by 3424
Michele Baldini

Michele Baldini

Leibniz Institute for Crystal Growth
Verified email at ikz-berlin.de
Cited by 3235
Jean Decobert

Jean Decobert

III-V Lab
Verified email at 3-5lab.fr
Cited by 3044
Simon Rushworth

Simon Rushworth

EpiValence, Epichem, SAFC Hitech, Tyndall R&D projects
Verified email at tiscali.co.uk
Cited by 2866
1 - 10