charles dennison

charles dennison

Intel
Verified email at intel.com
Cited by 12660
NAND DRAM Phase change Ovonyx VLSI
Rino Micheloni

Rino Micheloni

Microsemi
Verified email at ieee.org
Cited by 5597
Flash memories NAND SSD ECC LDPC
Chen Yang Yin 陈杨胤

Chen Yang Yin 陈杨胤

SanDisk
Verified email at sandisk.com
Cited by 5323
Emerging memory ReRAM SCM NAND STT-MRAM
Jun Wan

Jun Wan

Micron
Verified email at micron.com
Cited by 2405
NAND flash memory SSD system architecture
Guiqiang Dong

Guiqiang Dong

PhD from Rensselaer Polytechnic Institute
Cited by 1527
Video/Data Compression LDPC SSD NAND FTL
Byung Yong Choi

Byung Yong Choi

Samsung Electronics
Verified email at samsung.com
Cited by 1521
Semiconductor Flash Memory NAND 3D NAND Yield Management
Richard Hill

Richard Hill

Manager - Micron
Verified email at micron.com
Cited by 1490
NAND III-V MOSFETs CMOS
Haibo Li

Haibo Li

Purdue University, Sandisk, Western Digital, SK Hynix memory solutions, Yangtze Memory …
Verified email at micron.com
Cited by 1464
NAND flash memory non-volatile memory semiconductor device SSD
Rock-Hyun Baek

Rock-Hyun Baek

POSTECH, Electrical Engineering
Verified email at postech.ac.kr
Cited by 1403
Gate-All-Around FinFET Machine Learning NAND 3DIC
Chen Jin

Chen Jin

Engineer, Micron Technology
Verified email at micron.com
Cited by 1218
NAND GaN radiation reliability
1 - 10