Mark Biesinger

Mark Biesinger

Surface Science Western, University of Western Ontario
Verified email at uwo.ca
Cited by 26059
Surface Science Surface Analysis X-ray Photoelectron Spectroscopy XPS ToF-SIMS
Alain Brunelle

Alain Brunelle

CNRS Research Director (DR1)
Verified email at cnrs.fr
Cited by 9115
Mass Spectrometry Mass Spectrometry Imaging TOF-SIMS Polyatomic Ion Sources
Zihua Zhu

Zihua Zhu

Pacific Northwest National Laboratory (PNNL)
Verified email at pnnl.gov
Cited by 8922
Secondary ion mass spectrometry (SIMS) ToF-SIMS NanoSIMS
William D. A. Rickard

William DA Rickard

John de Laeter Centre, Curtin University
Verified email at curtin.edu.au
Cited by 6161
Nano/microanalysis FIB-SEM ToF-SIMS Geopolymers Geoscience
Michael Lee

Michael Lee

Assistant Professor of Analytical Chemistry, Chemistry and Biochemistry, Northern Arizona …
Verified email at nau.edu
Cited by 6059
collaborative interdisciplinary analytical … surface chemistry tof-sims
Xiao-Ying Yu

Xiao-Ying Yu

Oak Ridge National Laboratory
Verified email at ornl.gov
Cited by 4939
imaging kinetics microfluidics ToF-SIMS aerosol
Daniel J. Graham

Daniel J. Graham

University of Washington
Verified email at uw.edu
Cited by 4685
ToF-SIMS imaging multivariate analysis PCA MCR
Paul Pigram

Paul Pigram

La Trobe University, Melbourne, Australia
Verified email at latrobe.edu.au
Cited by 4640
Surface Science Surface Analysis ToF-SIMS X-ray Photoelectron Spectroscopy XPS
Thomas P Beebe Jr

Thomas P Beebe Jr

University of Delaware
Verified email at udel.edu
Cited by 4092
surface chemistry surface analysis XPS TOF-SIMS
Barry Brennan

Barry Brennan

Atlantic Technological University
Verified email at atu.ie
Cited by 3935
Graphene III-V semiconductors XPS ToF-SIMS
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