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Daniel James White

Daniel James White

metrology engineer at infineon
Verified email at infineon.com
Cited by 59364
thin film metrology and scatterometry microscopy fluorescence superresolution cell biology
Hans Reisinger

Hans Reisinger

Infineon AG
Verified email at infineon.com
Cited by 7201
Reliability Physics
Oliver Häberlen

Oliver Häberlen

Infineon Technologies Austria AG
Verified email at infineon.com
Cited by 6271
Florian Mendel

Florian Mendel

Cryptographer & Security Architect - Infineon Technologies
Verified email at infineon.com
Cited by 5975
Cryptography Information Security Hardware Security
Yves Colombe

Yves Colombe

Infineon Technologies, Austria
Verified email at infineon.com
Cited by 4768
Ion traps Trapped ions Quantum computing Quantum physics
Praveen kumar Ramamoorthy

Praveen kumar Ramamoorthy

Staff Engineer at Infineon Technologies
Verified email at infineon.com
Cited by 3456
Test Technology Innovation & Development Test Process & Equipment Development Product & Process Optimisation
Michael Nelhiebel

Michael Nelhiebel

KAI GmbH / Infineon Technologies Austria AG
Verified email at infineon.com
Cited by 3293
semiconductor technology semiconductor devices reliability materials
Hutomo Suryo Wasisto

Hutomo Suryo Wasisto

Infineon Technologies AG
Verified email at infineon.com
Cited by 3288
MEMS/NEMS Nanosensors Nanooptoelectronics Nanobattery Semiconductor Technology
Martin Schläffer

Martin Schläffer

Infineon Technologies
Verified email at infineon.com
Cited by 3184
cryptography algorithms
Dominik Heiss

Dominik Heiss

Infineon AG
Verified email at infineon.com
Cited by 3040
Technology Development Bipolar Transistors Laser Integrated photonics Semiconductor physics
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