| Single-Event Effects in Heavy-Ion Irradiated 3kV SiC Charge-Balanced Power Devices A Sengupta, DR Ball, S Islam, AS Senarath, AL Sternberg, EX Zhang, ... IEEE Transactions on Nuclear Science, 2024 | | 2024 |
| Single Event Functional Interrupt (SEFI) Sensitivities of a Multicore Microprocessor S Esquer, BD Sierawski, AF Witulski, RD Schrimpf, G Karsai, M Turowski 2024 IEEE Aerospace Conference, 1-11, 2024 | | 2024 |
| LET and voltage dependence of single-event burnout and single-event leakage current in high-voltage SiC power devices A Sengupta, DR Ball, AL Sternberg, S Islam, AS Senarath, RA Reed, ... IEEE Transactions on Nuclear Science, 2024 | 3 | 2024 |
| Incorporating component-level testing into Bayesian degradation distributions to estimate a voltage regulator’s radiation failure probabilities RH Nederlander, AF Witulski, RA Reed, G Karsai, RL Ladbury, EX Zhang, ... IEEE Transactions on Nuclear Science 70 (8), 2051-2059, 2023 | 1 | 2023 |
| Influence of Radiation Environment Variability on Cumulative Heavy-Ion-Induced Leakage Current in SiC Power Devices RA Johnson, AF Witulski, BD Sierawski, DR Ball, KF Galloway, ... IEEE Transactions on Nuclear Science 70 (4), 322-327, 2023 | 1 | 2023 |
| Impact of heavy-ion range on single-event effects in silicon carbide power junction barrier Schottky diodes A Sengupta, DR Ball, AF Witulski, EX Zhang, RD Schrimpf, KF Galloway, ... IEEE Transactions on Nuclear Science 70 (4), 394-400, 2023 | 10 | 2023 |
| Low-energy ion-induced single-event burnout in gallium oxide Schottky diodes RM Cadena, DR Ball, EX Zhang, S Islam, A Senarath, MW McCurdy, ... IEEE Transactions on Nuclear Science 70 (4), 363-369, 2023 | 13 | 2023 |
| Fault Propagation in Microprocessors with Configurable Cache Memory S Esquer, B Shani, AF Witulski, BD Sierawski, BL Bhuva, RA Reed, ... 2022 22nd European Conference on Radiation and Its Effects on Components and …, 2022 | | 2022 |
| Methodology for Correlating Historical Degradation Data to Radiation-Induced Degradation System Effects in Small Satellites RH Nederlander, AF Witulski, RA Reed, E Zhang, RD Schrimpf, ... | | 2022 |
| Analysis of heavy-ion-induced leakage current in SiC power devices RA Johnson, AF Witulski, DR Ball, KF Galloway, AL Sternberg, RA Reed, ... IEEE Transactions on Nuclear Science 69 (3), 248-253, 2021 | 8 | 2021 |
| System-level uncertainty quantification from component-level radiation effects G Karsai, N Mahadevan, AF Witulski, A Sternberg, J Kauppila, P Adell, ... 2021 21th European Conference on Radiation and Its Effects on Components and …, 2021 | 2 | 2021 |
| Connecting Mission Profiles and Radiation Vulnerability Assessment RH Nederlande, KL Ryder, AF Witulski, G Karsai, N Mahadevan, ... 35th Annual Small Satellite Conference (SmallSat) 2021, 2021 | 1 | 2021 |
| Systematic Propagation of Component-Level Failure Effects for Spacecraft Reliability Evaluation M Reaz, R Alles, A Witulski, G Karsai, N Mahadevan, B Sierawski, R Reed, ... TRISMAC 2021 Trilateral Safety & Mission Assurance Conference (TRISMAC), 2021 | | 2021 |
| Effects of breakdown voltage on single-event burnout tolerance of high-voltage SiC power MOSFETs DR Ball, KF Galloway, RA Johnson, ML Alles, AL Sternberg, AF Witulski, ... IEEE Transactions on Nuclear Science 68 (7), 1430-1435, 2021 | 38 | 2021 |
| A system-level modeling approach for simulating radiation effects in successive-approximation analog-to-digital converters MW Rony, EX Zhang, M Reaz, K Li, A Daniel, B Rax, P Adell, J Kauppila, ... IEEE Transactions on Nuclear Science 68 (7), 1465-1472, 2021 | 2 | 2021 |
| Modeling COTS System TID Response With Monte Carlo Sampling and Transistor Swapping Experiments MB Smith, AF Witulski, JS Kauppila, AL Sternberg, KL Ryder, ... IEEE Transactions on Nuclear Science 68 (5), 1008-1013, 2021 | | 2021 |
| Online Small-Sat Knowledge Repositories and Modeling Tools for Risk Reduction and Enhanced Mission Success A Witulski, B Sierawski, G Karsai, N Mahadevan, R Reed, R Schrimpf, ... | | 2021 |
| Model Based Systems Engineering for CubeSat Mission Reliability T Rakalina, M Izygon, L Wang, I Conway, S Radu, N Ishihama, M Feather, ... | 1 | 2021 |
| Systems engineering and assurance modeling (SEAM): A web-based solution for integrated mission assurance KL Ryder, R Alles, G Karsai, N Mahadevan, JW Evans, AF Witulski, ... Facta universitatis-series: Electronics and Energetics 34 (1), 1-20, 2021 | 10 | 2021 |
| Effective Small-Satellite Radiation Assurance for Non-Specialists RA Austin, BD Sierawski, AF Witulski, RD Schrimpf, RA Reed Public website, 2020 | | 2020 |
Ron SchrimpfProfessor of Electrical Engineering, Vanderbilt UniversityVerified email at vanderbilt.edu
