| Cell-Aware Test on Various Circuits in an Advanced 3nm Technology Z Gao, MC Hu, R Baert, B Chehab, J Swenton, S Malagi, J Huisken, ... IEEE Design & Test, 2023 | | 2023 |
| Dilate-invariant temporal convolutional network for real-time edge applications EA Ibrahim, B van den Dool, S De, MD Gomony, J Huisken, M Geilen IEEE Transactions on Circuits and Systems I: Regular Papers 69 (3), 1210-1220, 2021 | 3 | 2021 |
| Multi-level optimization of an ultra-low power brainwave system for non-convulsive seizure detection B de Bruin, K Singh, Y Wang, J Huisken, JP de Gyvez, H Corporaal IEEE Transactions on Biomedical Circuits and Systems 15 (5), 1107-1121, 2021 | 9 | 2021 |
| Converter-free power delivery using voltage stacking for near/subthreshold operation K Singh, B de Bruin, H Jiao, J Huisken, H Corporaal, JP de Gyvez IEEE Transactions on Very Large Scale Integration (VLSI) Systems 29 (6 …, 2021 | 4 | 2021 |
| Reducing Library Characterization Time for Cell-aware Test while Maintaining Test Quality Z Gao, MC Hu, S Malagi, J Swenton, J Huisken, K Goossens, ... Journal of Electronic Testing 37 (2), 161-189, 2021 | 1 | 2021 |
| Standard cell based memory compiler for near/sub-threshold operation J Zhou, K Singh, J Huisken 2020 27th IEEE International Conference on Electronics, Circuits and Systems …, 2020 | 2 | 2020 |
| BrainWave: An energy-efficient EEG monitoring system-Evaluation and trade-offs B de Bruin, K Singh, J Huisken, H Corporaal Proceedings of the ACM/IEEE International Symposium on Low Power Electronics …, 2020 | 4 | 2020 |
| An electromagnetic energy harvester and power management in 28-nm fdsoi for iot S Sedighiani, K Singh, J Huisken, R Jordans, P Harpe, JP De Gyvez 2020 9th Mediterranean Conference on Embedded Computing (MECO), 1-5, 2020 | 3 | 2020 |
| Tightening the mesh size of the cell-aware ATPG net for catching all detectable weakest faults MC Hu, Z Gao, S Malagi, J Swenton, J Huisken, K Goossens, CW Wu, ... 2020 IEEE European Test Symposium (ETS), 1-6, 2020 | 5 | 2020 |
| Low complexity multi-directional in-air ultrasonic gesture recognition using a TCN EA Ibrahim, M Geilen, J Huisken, M Li, JP de Gyvez 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE …, 2020 | 11 | 2020 |
| Trading sensitivity for power in an IEEE 802.15. 4 conformant adequate demodulator P Detterer, C Erdin, J Huisken, H Jiao, M Nabi, T Basten, JP De Gyvez 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE …, 2020 | 3 | 2020 |
| Application of cell-aware test on an advanced 3nm CMOS technology library Z Gao, S Malagi, MC Hu, J Swenton, R Baert, J Huisken, B Chehab, ... 2019 IEEE International Test Conference (ITC), 1-6, 2019 | 15 | 2019 |
| Voltage Stacking for Near/Sub-threshold Ultra-Low Power Microprocessor Systems K Singh, B de Bruin, J Huisken, H Jiao, H Corporaal, JP de Gyvez 2019 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference …, 2019 | 2 | 2019 |
| Power and Variation Improved Near-Vt Standard Cell Library for 28-nm FDSOI WT Wong, K Singh, J Huisken, JP De Gyvez 2019 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference …, 2019 | 7 | 2019 |
| Blocks: Redesigning coarse grained reconfigurable architectures for energy efficiency M Wijtvliet, J Huisken, L Waeijen, H Corporaal 2019 29th International Conference on Field Programmable Logic and …, 2019 | 22 | 2019 |
| Voltage stacked design of a microcontroller for near/sub-threshold operation K Singh, B de Bruin, J Huisken, H Jiao, JP de Gyvez 2019 32nd IEEE International System-on-Chip Conference (SOCC), 370-375, 2019 | 4 | 2019 |
| Optimization of cell-aware ATPG results by manipulating library cells' defect detection matrices Z Gao, MC Hu, J Swenton, S Malagi, J Huisken, K Goossens, ... 2019 IEEE International Test Conference in Asia (ITC-Asia), 91-96, 2019 | 13 | 2019 |
| Keyword spotting using time-domain features in a temporal convolutional network EA Ibrahim, J Huisken, H Fatemi, JP de Gyvez 2019 22nd Euromicro Conference on Digital System Design (DSD), 313-319, 2019 | 10 | 2019 |
| An automated approximation methodology for arithmetic circuits S De, J Huisken, H Corporaal 2019 IEEE/ACM International Symposium on Low Power Electronics and Design …, 2019 | 11 | 2019 |
| Defect-location identification for cell-aware test Z Gao, S Malagi, EJ Marinissen, J Swenton, J Huisken, K Goossens 2019 IEEE Latin American Test Symposium (LATS), 1-6, 2019 | 20 | 2019 |
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