| A Bayesian approach to the estimation of change-point in a hazard rate JK Ghosh, SN Joshi, C Mukhopadhyay Advances in Reliability, 141-170, 1993 | 18 | 1993 |
| A Case of US and India KK Kumar, C Mukhopadhyay NSE Research Paper 16, 2002 | 53 | 2002 |
| A multi-layer perceptron based non-linear mixture model to estimate class abundance from mixed pixels U Kumar, SK Raja, C Mukhopadhyay, TV Ramachandra IEEE Technology Students' Symposium, 148-153, 2011 | 8 | 2011 |
| A neural network based hybrid mixture model to extract information from non-linear mixed pixels U Kumar, KS Raja, C Mukhopadhyay, TV Ramachandra Information 3 (3), 420-441, 2012 | 17 | 2012 |
| Advanced Machine Learning Algorithms based Free and Open Source Packages for Landsat ETM+ Data Classification U Kumar, A Dasgupta, C Mukhopadhyay, TV Ramachandra Proceedings of the OSGEO-India: FOSS4G, 1-7, 2012 | 6 | 2012 |
| An analysis of patent pricing. M Mathew, C Mukhopadhyay, D Raju, SS Nair, D Nag Decision (0304-0941) 39 (1), 2012 | 13 | 2012 |
| Assimilation of endmember variability in spectral for urban land cover extraction mixture analysis U Kumar, KS Raja, C Mukhopadhyay, TV Ramachandra ADVANCES IN SPACE RESEARCH 52 (11), 2015-2033, 2013 | | 2013 |
| Assimilation of endmember variability in spectral mixture analysis for urban land cover extraction U Kumar, SK Raja, C Mukhopadhyay, TV Ramachandra Advances in Space Research 52 (11), 2015-2033, 2013 | 10 | 2013 |
| Bayesian accelerated life testing under competing exponential causes of failure S Roy, C Mukhopadhyay Quality and reliability engineering—recent trends and future directions …, 2013 | 1 | 2013 |
| Bayesian accelerated life testing under competing log-location-scale family of causes of failure C Mukhopadhyay, S Roy Computational Statistics 31, 89-119, 2016 | 19 | 2016 |
| Bayesian accelerated life testing under competing Weibull causes of failure S Roy, C Mukhopadhyay Communications in Statistics-Theory and Methods 43 (10-12), 2429-2451, 2014 | 10 | 2014 |
| Bayesian analysis for masked system failure data using non-identical Weibull models S Basu, PB Asit, C Mukhopadhyay Journal of Statistical Planning and Inference 78 (1-2), 255-275, 1999 | 78 | 1999 |
| Bayesian analysis of a superimposed renewal process C Mukhopadhyay, MP Samuel Communications in Statistics-Theory and Methods 40 (2), 279-303, 2010 | 3 | 2010 |
| Bayesian analysis of competing risks, changepoint and related models C Mukhopadhyay University of Missouri-Columbia, 1992 | | 1992 |
| Bayesian analysis of incomplete time and cause of failure data C Mukhopadhyay, AP Basu Journal of Statistical Planning and Inference 59 (1), 79-100, 1997 | 46 | 1997 |
| Bayesian analysis of masked series system lifetime data C Mukhopadhyay, S Basu Communications in Statistics—Theory and Methods 36 (2), 329-348, 2007 | 35 | 2007 |
| Bayesian Analysis of Masked Series System Lifetime Data with log-Normal Component Lives C Mukhopadhyay, S Basu | | |
| Bayesian D-optimal Accelerated Life Test plans for series systems with competing exponential causes of failure S Roy, C Mukhopadhyay Journal of Applied Statistics 43 (8), 1477-1493, 2016 | 9 | 2016 |
| Bayesian Estimation of Lifetime C Mukhopadhyay, AP Basu IAPQR TRANSACTIONS 20, 133-144, 1995 | | 1995 |
| Bayesian Price: Threshold Estimation C Mukhopadhyay Indian Journal of Marketing 34 (2), 2004 | | 2004 |